Online Tests - Detailed Schedule For GATE 2012 Branch: EEE All Tests will be open till second week of Feb 2012, Student can attempt each test only once. Prepare for the test before attempting it. Chapter-wise Tests (Each test carries 25 marks and 45 minutes duration. Test consists of 5 one mark questions and 10 two mark questions)
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEEC-Test1 | DC Analysis Voltage Division, Current Division, K-Laws, Nodal, Mesh Analysis, Source Transformation, Power Dissipation, Y-Δ Transformation, Quality, Graph Theory. | Electrical Circuits & Fields Test code: EEEC No. of test: 5 | Available from Aug 16th 2011 |
| EEEC-Test2 | AC Analysis AC fundamentals, RMS, Avg. Values, Steady State Analysis | Available from Aug 22nd 2011 |
| EEEC-Test3 | Two port N/W & Theorems | Available from Aug 28th 2011 |
| EEEC-Test4 | Transient Analysis | Available from Sept 3rd 2011 |
| EEEC-Test5 | Resonance, Mag. Coupling CKTs, 3Ø Circuits | Available from Sept 8th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EECS-Test1 | Introduction, Signal Flow Graph and Block Diagram | Control systems Test code: EECS No. of test: 6 | Available from Aug 16th 2011 |
| EECS-Test2 | Routh Hurwitz Stability criteria | Available from Aug 25th 2011 |
| EECS-Test3 | Time Response Analysis | Available from Sept 2nd 2011 |
| EECS-Test4 | Root Locus Diagram RLD | Available from Sept 9th 2011 |
| EECS-Test5 | Frequency Response Analysis | Available from Sept 16th 2011 |
| EECS-Test6 | State Space Analysis & Controller | Available from Sept 22nd 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEMA-Test1 | Single Phase Transformers | Machines Test code: EEMA No. of test: 6 | Available from Aug 17th 2011 |
| EEMA-Test2 | Three Phase Transformers | Available from Aug 26th 2011 |
| EEMA-Test3 | Working Principle & Performance of Induction Machines | Available from Sept 4th 2011 |
| EEMA-Test4 | Speed Control & Starting Methods | Available from Sept 10th 2011 |
| EEMA-Test5 | Synchronous Machines & Misc. Machine | Available from Sept 18th 2011 |
| EEMA-Test6 | DC Machines | | Available from Sept 23rd 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEAC-Test1 | Diodes & Its Application | Analog Circuits Test code: EEAC No. of test: 5 | Available from Aug 16th 2011 |
| EEAC-Test2 | BJT & Biasing, FET & Biasing | Available from Aug 25th 2011 |
| EEAC-Test3 | Transistor Amplifier & Feedback Amplifier | Available from Sept 2nd 2011 |
| EEAC-Test4 | Op-Amp Application | Available from Sept 9th 2011 |
| EEAC-Test5 | Oscillators & 555 Timer | Available from Sept 16th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEDC-Test1 | Logic Gates | Digital Circuits & Microprocessor Test code: EEDC No. of test: 6 | Available from Aug 16th 2011 |
| EEDC-Test2 | Boolean Algebra & K-Maps | Available from Aug 25th 2011 |
| EEDC-Test3 | Combinational Circuits | Available from Sept 1st 2011 |
| EEDC-Test4 | Sequential Circuits | Available from Sept 9th 2011 |
| EEDC-Test5 | A/D & D/A converters | Available from Sept 16th 2011 |
| EEDC-Test6 | Microprocessor | Available from Sept 22nd 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EESS-Test1 | Introduction & LTI (LSI) System | Signals & Systems Test code: EESS No. of test: 5 | Available from Aug 16th 2011 |
| EESS-Test2 | Fourier Series & Transform | Available from Aug 25th 2011 |
| EESS-Test3 | Laplace Transform | Available from Sept 2nd 2011 |
| EESS-Test4 | DTFT & Z-Transform | Available from Spet 9th 2011 |
| EESS-Test5 | DFT & FFT | Available from Sept 16th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEME-Test1 | Fundamentals, Error Analysis & Basic Instruments | Measurements Test code: EEME No. of test: 3 | Available from Aug 17th 2011 |
| EEME-Test2 | Measurement of Power, Energy & bridges | Available from Aug 26th 2011 |
| EEME-Test3 | Q – Meter, Oscilloscope, Potentiometric Recorders, Digital, Voltmeters, Multimeters Rectifier Intruments | Available from Sept 4th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEEF-Test1 | EMF | Electromagnetic Field Test code: ECEF No. of test: 1 | Available from Sept 4th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEPE-Test1 | Semiconductor Power Devices – Diodes, Transistors, Thyristors, triacs, GTOs, Static Characteristics & Principles of Operations Triggering Circuits | Power Electronics Test code: EEPE No. of test: 5 | Available from Aug 17th 2011 |
| EEPE-Test2 | Phase Controlled Rectifiers | Available from Aug 26th 2011 |
| EEPE-Test3 | Choppers | Available from Sept 10th 2011 |
| EEPE-Test4 | Inverters | Available from Sept 18th 2011 |
| EEPE-Test5 | Drives (A.C. & D.C.) Power BJT. MOSFET & Commutation Techniques | Available from Sept 23rd 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEPS-Test1 | Line Constants, Performance of Lines | Power Systems Test code: EEPS No. of test: 6 | Available from Aug 17th 2011 |
| EEPS-Test2 | Insulators, Cables, Distribution & Voltage Control | Available from Aug 26th 2011 |
| EEPS-Test3 | Symmetrical Components, Fault Calculations & Per Unit Analysis | Available from Sept 4th 2011 |
| EEPS-Test4 | Stability | Available from Sept 10th 2011 |
| EEPS-Test5 | Economic Load Dispatch & Load Flow Studies | Available from Sept 18th 2011 |
| EEPS-Test6 | Protection, Circuit Breaker & Generation | Available from Sept 23rd 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| EEEM-Test1 | Probability & Statistics | ENGG. Mathematics Test code: EEEM No. of test: 7 | Available from Aug 16th 2011 |
| EEEM-Test2 | Linear Algebra | Available from Aug 22nd 2011 |
| EEEM-Test3 | Calculus- Vector Calculus, Fourier Series | Available from Aug 28th 2011 |
| EEEM-Test4 | Differential Equations | Available from Sept 3rd 2011 |
| EEEM-Test5 | Transform Theory | Available from Sept 8th 2011 |
| EEEM-Test6 | Complex Variables | Available from Sept 12th 2011 |
| EEEM-Test7 | Numerical Methods | Available from Sept 18th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| GAVA-Test1 | Verbal Analogies, Word Groups & Instructions Critical Reasoning and Verbal Deduction. | Verbal Ability {English} GA Test code: GAVA No. of test: 2 | Available from Aug 16th 2011 |
| GAVA-Test2 | English grammar & Sentence Completion Critical Reasoning and Verbal Deduction | Available from Aug 25th 2011 |
| TEST Code | Topic/Chapter | Subject | Date (Available from) |
| GANA-Test1 | Numerical Estimation Numerical Reasoning. | Numerical Ability {Aptitude} GA Test code: GANA No. of test: 3 | Available from Aug 21st 2011 |
| GANA-Test2 | Numerical Computation. | Available from Aug 28th 2011 |
| GANA-Test3 | Data Interpretation. | Available from Sept 5th 2011 |
Subject-wise Grand Tests 1st Series (Each test carries 50 marks and 90 minutes duration. Test consists of 10 one mark questions and 20 two mark questions) 1st Series: Commence from 05th October 2011 onwards, the detailed test schedule is as follows:
| Test Code | Subject Grand Test | Date (Available from) |
| GT-GAGE1 | General Aptitude + General English | 2011 Oct 05th Wednesday |
| GT-EEEM1 | Engineering Mathematics | 2011 Oct 06th Thursday |
| GT-EEEC1 | Electrical Circuits & Fields | 2011 Oct 07th Friday |
| GT-EEEM1 | Electrical Machines | 2011 Oct 08th Saturday |
| GT-EEAC1 | Analog Circuits | 2011 Oct 10th Monday |
| GT-EEDC1 | Digital Circuits | 2011 Oct 11th Tuesday |
| GT-EES1 | Signals & Systems | 2011 Oct 12th Wednesday |
| GT-EECS1 | Control Systems | 2011 Oct 13th Thursday |
| GT-EEPS1 | Power systems | 2011 Oct 14th Friday |
| GT-EEEF1 | Electromagnetic Fields | 2011 Oct 15th Saturday |
| GT-EEME1 | Measurements | 2011 Oct 17th Monday |
| GT-EEPE1 | Power electronics and Drives | 2011 Oct 18th Tuesday |
Subject-wise Grand Tests 2nd Series (Each test carries 50 marks and 90 minutes duration. Test consists of 10 one mark questions and 20 two mark questions) 2nd Series: Commence from 05th January 2012 onwards, the detailed test schedule is as follows:
| Test Code | Subject Grand Test | Date (Available from) |
| GT-GAGE2 | General Aptitude + General English | 2012 Jan 05th Thursday |
| GT-EEEM2 | Engineering Mathematics | 2012 Jan 06th Friday |
| GT-EEEC2 | Electrical Circuits & Fields | 2012 Jan 7th Saturday |
| GT-EEEM2 | Electrical Machines | 2012 Jan 9th Monday |
| GT-EEAC2 | Analog Circuits | 2012 Jan 10th Tuesday |
| GT-EEDC2 | Digital Circuits | 2012 Jan 11th Wednesday |
| GT-EES2 | Signals & Systems | 2012 Jan 12th Thursday |
| GT-EECS2 | Control Systems | 2012 Jan 13th Friday |
| GT-EEPS2 | Power systems | 2012 Jan 14th Saturday |
| GT-EEEF2 | Electromagnetic Fields | 2012 Jan 16th Monday |
| GT-EEME2 | Measurements | 2012 Jan 17th Tuesday |
| GT-EEPE2 | Power electronics and Drives | 2012 Jan 18th Wednesday |
Multiple Subject Grand Tests(MSGT) (Each test carries 75 marks and 2Hr and 15 min duration. Test consists of 15 one mark questions and 30 two mark questions)
| TEST | Description | Date (Available from) |
| | 1st Series (in the month of November) | |
| NOV-EEMSGT-1 | Aptitude + Maths + General English | 2011 Nov 6th |
| NOV-EEMSGT-2 | Electrical Circuits & Fields + Controls + Analog + Digital and microprocessor | 2011 Nov 13th |
| NOV-EEMSGT-3 | Power systems + machines + Power Electronics + measurements + Electromagnetic Field | 2011 Nov 20th |
| | 2nd Series (in the month of December) | |
| DEC-EEMSGT-1 | Aptitude + Maths + General English | 2011 Dec 4th |
| DEC-EEMSGT-2 | Electrical Circuits & Fields + Controls + Analog + Digital and microprocessor | 2011 Dec 11th |
| DEC-EEMSGT-3 | Power systems + machines + Power Electronics + measurements + Electromagnetic Field | 2011 Dec 18th |
| | 3rd Series (in the month of January 2012) | |
| JAN-EEMSGT-1 | Aptitude + Maths + General English | 2012 Jan 1st |
| JAN-EEMSGT-2 | Electrical Circuits & Fields + Controls + Analog + Digital and microprocessor | 2012 Jan 8th |
| JAN-EEMSGT-3 | Power systems + machines + Power Electronics + measurements + Electromagnetic Field | 2012 Jan 15th |
Full Length Mock GATE (Each test carries 100 marks and 3 hours duration. As per GATE Pattern)
| TEST CODE | Full Length Mock GATE | Date (Available from) | Syllabus |
| EEMOCK1 | Mock – 1 | 2011 Sept 25th | Total syllabus |
| EEMOCK2 | Mock – 2 | 2011 Oct 30th | Total syllabus |
| EEMOCK3 | Mock – 3 | 2011 Nov 27th | Total syllabus |
| EEMOCK4 | Mock – 4 | 2011 Dec 25th | Total syllabus |
| EEMOCK5 | Mock – 5 | 2012 Jan 29th | Total syllabus |
| EEMOCK6 | Mock – 6 Final | 2012 Feb 05th | Total syllabus |
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